The experimental results show that the surface si - oh bonds infrared intensity of ultrafine silicon dioxide was decreased and thermogravimetric loss was increased by using fourier infrared ( ftir ) spectroscopy and thermogravimetric ( tg ) analyzer 傅立叶红外光谱和热重分析结果表明，改性后的超细二氧化硅颗粒表面的硅羟基吸收峰明显减小。
